Are you perplexed by these problems?
Integrated RJ45 socket
Manufactured to solve the pain point of Ethernet PHY chip development
Simplify hardware design, shorten development time
You only need to complete the wiring between the MAC controller of MCU and the pin of RJ45 socket. You don’t need to deal with the layout and design of peripheral circuits of PHY and transformer. You can easily use all the functions of embedded Ethernet.
Design at industrial grade, high reliability
Diverse development environments and data support
Provide drivers in the environment of Linux and AworksLP systems, and program SDK package of bare machine and SCM, and match with mainstream SCMs and ARM processor platforms.
Simple deployment, easy to use
Selection Table
| Product model | ePort-M | ePort-G | ePort-G(1.8) | DPort-M | DPort-G |
|---|---|---|---|---|---|
| Number of Ethernet interfaces | 1 | 1 | 1 | 2 | 2 |
| Master control interface | RMII | RGMII | RGMII | RMII | RGMII |
| Interface level | 3.3V | 3.3V | RGMII: 1.8V; IO: 3.3V | 3.3V | 3.3V |
| Rate | 10/100Mbps self-adaption | 10/100/1000Mbps self-adaption | 10/100/1000Mbps self-adaption | 10/100Mbps self-adaption | 10/100/1000Mbps self-adaption |
| Supply voltage | 3.3V±3% | 3.3V±3% | 3.3V±3% | 3.3V±3% | 3.3V±3% |
| Operating temperature | -40℃~+85℃ | -40℃~+85℃ | -40℃~+85℃ | -40℃~+85℃ | -40℃~+85℃ |
| Storage temperature | -45℃~+90℃ | -45℃~+90℃ | -45℃~+90℃ | -45℃~+90℃ | -45℃~+90℃ |
| Relative humidity | 5%~90% (non-condensing) | 5%~90% (non-condensing) | 5%~90% (non-condensing) | 5%~90% (non-condensing) | 5%~90% (non-condensing) |
| EMC | ESD immunity test: Level 4 Lightning (surge) immunity test: Level 3 EFT immunity test: Level 3 Test of conducted disturbance induced by RF field: 10V | ESD immunity test: Level 4 Lightning (surge) immunity test: Level 3 EFT immunity test: Level 3 Test of conducted disturbance induced by RF field: 10V | ESD immunity test: Level 4 Lightning (surge) immunity test: Level 3 EFT immunity test: Level 3 Test of conducted disturbance induced by RF field: 10V | ESD immunity test: Level 4 Lightning (surge) immunity test: Level 3 EFT immunity test: Level 3 Test of conducted disturbance induced by RF field: 10V | ESD immunity test: Level 4 Lightning (surge) immunity test: Level 3 EFT immunity test: Level 3 Test of conducted disturbance induced by RF field: 10V |
| Product purchase | Buy | ||||
